Best practices from nano-risk analysis relevant for other emerging technologies.

Published

Journal Article

Full Text

Duke Authors

Cited Authors

  • Grieger, K; Jones, JL; Hansen, SF; Hendren, CO; Jensen, KA; Kuzma, J; Baun, A

Published Date

  • November 2019

Published In

Volume / Issue

  • 14 / 11

Start / End Page

  • 998 - 1001

PubMed ID

  • 31695148

Pubmed Central ID

  • 31695148

Electronic International Standard Serial Number (EISSN)

  • 1748-3395

International Standard Serial Number (ISSN)

  • 1748-3387

Digital Object Identifier (DOI)

  • 10.1038/s41565-019-0572-1

Language

  • eng