Pulsed JR-FEL applications for the characterization of infrared optical materials
© 1994 SPIE. All rights reserved. Theoretical consideration of thermal lens effect due to linear and nonlinear opiical absorption is presented. Based on this model, Zscan technique, especially two-color Z-scan can be used to detect very low level of unpurities or defects in optical materials. Depending upon the optical crs section of the particular species being probed, two-color Z-scan can detect impurities, for example, the OH groups in fused silica at sub-ppm level by weight or better.
Mu, R; Henderson, DO; Johnson, JB; Edwards, GS
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