Pulsed JR-FEL applications for the characterization of infrared optical materials

Published

Conference Paper

© 1994 SPIE. All rights reserved. Theoretical consideration of thermal lens effect due to linear and nonlinear opiical absorption is presented. Based on this model, Zscan technique, especially two-color Z-scan can be used to detect very low level of unpurities or defects in optical materials. Depending upon the optical crs section of the particular species being probed, two-color Z-scan can detect impurities, for example, the OH groups in fused silica at sub-ppm level by weight or better.

Full Text

Duke Authors

Cited Authors

  • Mu, R; Henderson, DO; Johnson, JB; Edwards, GS

Published Date

  • July 27, 1994

Published In

Volume / Issue

  • 2138 /

Start / End Page

  • 97 - 106

Electronic International Standard Serial Number (EISSN)

  • 1996-756X

International Standard Serial Number (ISSN)

  • 0277-786X

Digital Object Identifier (DOI)

  • 10.1117/12.181347

Citation Source

  • Scopus