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Partial Bayesian Co-training for Virtual Metrology

Publication ,  Journal Article
Nguyen, CM; Li, X; Blanton, RDS
Published in: IEEE Transactions on Industrial Informatics
May 1, 2020

Building accurate regression models using limited data is a challenging problem in manufacturing data analysis. In this paper, we study a particular semisupervised learning problem where labeled data are limited, while unlabeled data are plentiful. In these conditions, conventional single-view learning methods are prone to overfitting. To tackle this problem, we develop a novel co-training technique, namely partial Bayesian co-training (PBCT). PBCT scales down the original set of features to create a partial view, and then exploit side information from the partial view to enhance the complete model. The PBCT model also allows integrating domain knowledge to enhance model accuracy. The proposed method is validated with experiments on industrial manufacturing data. The experimental results show that under a reduction of labeled data by up to 50%, a robust estimation is still attainable. This suggests that the PBCT model is a promising solution to a broad spectrum of applications.

Duke Scholars

Published In

IEEE Transactions on Industrial Informatics

DOI

EISSN

1941-0050

ISSN

1551-3203

Publication Date

May 1, 2020

Volume

16

Issue

5

Start / End Page

2937 / 2945

Related Subject Headings

  • Electrical & Electronic Engineering
  • 46 Information and computing sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 08 Information and Computing Sciences
 

Citation

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Nguyen, C. M., Li, X., & Blanton, R. D. S. (2020). Partial Bayesian Co-training for Virtual Metrology. IEEE Transactions on Industrial Informatics, 16(5), 2937–2945. https://doi.org/10.1109/TII.2019.2903718
Nguyen, C. M., X. Li, and R. D. S. Blanton. “Partial Bayesian Co-training for Virtual Metrology.” IEEE Transactions on Industrial Informatics 16, no. 5 (May 1, 2020): 2937–45. https://doi.org/10.1109/TII.2019.2903718.
Nguyen CM, Li X, Blanton RDS. Partial Bayesian Co-training for Virtual Metrology. IEEE Transactions on Industrial Informatics. 2020 May 1;16(5):2937–45.
Nguyen, C. M., et al. “Partial Bayesian Co-training for Virtual Metrology.” IEEE Transactions on Industrial Informatics, vol. 16, no. 5, May 2020, pp. 2937–45. Scopus, doi:10.1109/TII.2019.2903718.
Nguyen CM, Li X, Blanton RDS. Partial Bayesian Co-training for Virtual Metrology. IEEE Transactions on Industrial Informatics. 2020 May 1;16(5):2937–2945.

Published In

IEEE Transactions on Industrial Informatics

DOI

EISSN

1941-0050

ISSN

1551-3203

Publication Date

May 1, 2020

Volume

16

Issue

5

Start / End Page

2937 / 2945

Related Subject Headings

  • Electrical & Electronic Engineering
  • 46 Information and computing sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 08 Information and Computing Sciences