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Knowledge transfer in board-level functional fault identification using domain adaptation

Publication ,  Conference
Liu, M; Li, X; Chakrabarty, K; Gu, X
Published in: Proceedings - International Test Conference
November 1, 2019

High integration densities and design complexity make board-level functional fault identification extremely difficult. Machine-learning techniques can identify functional faults with high accuracy, but they require a large volume of data to achieve high prediction accuracy. This drawback limits the effectiveness of traditional machine-learning algorithms for training a model in the early stage of manufacturing, when only a limited amount of fail data and repair records are available. We propose a board-level diagnosis workflow that utilizes domain adaptation to transfer the knowledge learned from a mature board to a new board in the ramp-up phase. First, a metric is designed to evaluate the similarity between products, and based on the calculated value of the similarity, either a homogeneous or a heterogeneous domain adaptation algorithm is selected. Second, these domain adaptation algorithms utilize information from both the mature and the new boards with carefully designed domain-alignment rules and train a functional fault identification classifier. Three complex boards in volume production and one new board in the ramp-up phase are used to validate the proposed domain-adaptation approach in terms of the diagnosis accuracy.

Duke Scholars

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

ISBN

9781728148236

Publication Date

November 1, 2019

Volume

2019-November
 

Citation

APA
Chicago
ICMJE
MLA
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Liu, M., Li, X., Chakrabarty, K., & Gu, X. (2019). Knowledge transfer in board-level functional fault identification using domain adaptation. In Proceedings - International Test Conference (Vol. 2019-November). https://doi.org/10.1109/ITC44170.2019.9000172
Liu, M., X. Li, K. Chakrabarty, and X. Gu. “Knowledge transfer in board-level functional fault identification using domain adaptation.” In Proceedings - International Test Conference, Vol. 2019-November, 2019. https://doi.org/10.1109/ITC44170.2019.9000172.
Liu M, Li X, Chakrabarty K, Gu X. Knowledge transfer in board-level functional fault identification using domain adaptation. In: Proceedings - International Test Conference. 2019.
Liu, M., et al. “Knowledge transfer in board-level functional fault identification using domain adaptation.” Proceedings - International Test Conference, vol. 2019-November, 2019. Scopus, doi:10.1109/ITC44170.2019.9000172.
Liu M, Li X, Chakrabarty K, Gu X. Knowledge transfer in board-level functional fault identification using domain adaptation. Proceedings - International Test Conference. 2019.

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

ISBN

9781728148236

Publication Date

November 1, 2019

Volume

2019-November