Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis
Published
Conference Paper
© 2020 SPIE. We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (Pe). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.
Full Text
Duke Authors
Cited Authors
- Ding, Y; Coccarelli, D; Hurlock, A; Greenberg, JA; Gehm, M; Ashok, A
Published Date
- January 1, 2020
Published In
Volume / Issue
- 11404 /
Electronic International Standard Serial Number (EISSN)
- 1996-756X
International Standard Serial Number (ISSN)
- 0277-786X
International Standard Book Number 13 (ISBN-13)
- 9781510635852
Digital Object Identifier (DOI)
- 10.1117/12.2558267
Citation Source
- Scopus