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Leveraging 3D vertical RRAM to developing neuromorphic architecture for pattern classification

Publication ,  Conference
Kim, B; Li, H
Published in: Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
July 1, 2020

The crossbar architecture with resistive random-access memory (RRAM) devices presents many advantages in realizing matrix-based computations and achieves success in neural network implementation. However, the rapid growth of network size demands even denser structures. In this paper, we investigate the neuromorphic hardware design based on the three-dimensional vertical RRAM (3D VRRAM) with an even/odd word line (WL) structure. The increased interconnects of VRRAM aggravate the chronic problems of the crossbar structure like the sneak path currents. We address this issue by attaining a balanced structure with high nonlinear RRAM devices. Furthermore, the impact of complicated signal routing and control due to the vertically stacked structure can be alleviated through architectural level optimization. A three-layer VRRAM structure is demonstrated for neuromorphic design by showing that 8X8-pixel images were successfully classified into three alphabet characters on this structure. The example design also verifies that the 3D VRRAM with even/odd WL structure is beneficial to acquire high area efficiency.

Duke Scholars

Published In

Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI

DOI

EISSN

2159-3477

ISSN

2159-3469

ISBN

9781728157757

Publication Date

July 1, 2020

Volume

2020-July

Start / End Page

258 / 263
 

Citation

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MLA
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Kim, B., & Li, H. (2020). Leveraging 3D vertical RRAM to developing neuromorphic architecture for pattern classification. In Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI (Vol. 2020-July, pp. 258–263). https://doi.org/10.1109/ISVLSI49217.2020.00054
Kim, B., and H. Li. “Leveraging 3D vertical RRAM to developing neuromorphic architecture for pattern classification.” In Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI, 2020-July:258–63, 2020. https://doi.org/10.1109/ISVLSI49217.2020.00054.
Kim B, Li H. Leveraging 3D vertical RRAM to developing neuromorphic architecture for pattern classification. In: Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI. 2020. p. 258–63.
Kim, B., and H. Li. “Leveraging 3D vertical RRAM to developing neuromorphic architecture for pattern classification.” Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI, vol. 2020-July, 2020, pp. 258–63. Scopus, doi:10.1109/ISVLSI49217.2020.00054.
Kim B, Li H. Leveraging 3D vertical RRAM to developing neuromorphic architecture for pattern classification. Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI. 2020. p. 258–263.

Published In

Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI

DOI

EISSN

2159-3477

ISSN

2159-3469

ISBN

9781728157757

Publication Date

July 1, 2020

Volume

2020-July

Start / End Page

258 / 263