SRAM parametric failure analysis

Conference Paper

With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical performance models with accuracy sufficient to facilitate probability extraction for SRAM parametric failures. A piecewise modeling technique is first proposed to capture the performance metrics over the large variation space. A controlled sampling scheme and a nested Monte Carlo analysis method are then applied for the failure probability extraction at cell-level and array-level respectively. Our 65nm SRAM example demonstrates that by combining the piecewise model and the fast probability extraction methods, we have significantly accelerated the SRAM failure analysis. Copyright 2009 ACM.

Full Text

Duke Authors

Cited Authors

  • Wang, J; Yaldiz, S; Li, X; Pileggi, LT

Published Date

  • January 1, 2009

Published In

Start / End Page

  • 496 - 501

International Standard Serial Number (ISSN)

  • 0738-100X

International Standard Book Number 13 (ISBN-13)

  • 9781605584973

Digital Object Identifier (DOI)

  • 10.1145/1629911.1630041

Citation Source

  • Scopus