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A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications

Publication ,  Conference
Zhao, S; Li, X; Chen, YC
Published in: IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
September 1, 2020

In recent years, classification techniques have been broadly adopted for a variety of smart manufacturing applications, including system health maintenance, defect detection and diagnosis, etc. However, most classification methods require a large set of training data that are accurately labeled by human experts in a specific domain. Collecting these training data is time-consuming and prohibitively expensive in practical applications. To overcome this challenge, we develop a classification framework using imperfectly labeled data. First, a statistical model is proposed to derive a set of probabilistic labels with consideration of labeling errors. Next, an accurate classifier is trained from these inaccurate labels. As demonstrated by the experimental results of two industrial examples, the proposed framework achieves superior classification accuracy over other conventional approaches.

Duke Scholars

Published In

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

DOI

EISSN

1946-0759

ISSN

1946-0740

ISBN

9781728189567

Publication Date

September 1, 2020

Volume

2020-September

Start / End Page

921 / 928
 

Citation

APA
Chicago
ICMJE
MLA
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Zhao, S., Li, X., & Chen, Y. C. (2020). A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications. In IEEE International Conference on Emerging Technologies and Factory Automation, ETFA (Vol. 2020-September, pp. 921–928). https://doi.org/10.1109/ETFA46521.2020.9211878
Zhao, S., X. Li, and Y. C. Chen. “A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications.” In IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, 2020-September:921–28, 2020. https://doi.org/10.1109/ETFA46521.2020.9211878.
Zhao S, Li X, Chen YC. A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications. In: IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. 2020. p. 921–8.
Zhao, S., et al. “A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications.” IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, vol. 2020-September, 2020, pp. 921–28. Scopus, doi:10.1109/ETFA46521.2020.9211878.
Zhao S, Li X, Chen YC. A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications. IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. 2020. p. 921–928.

Published In

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

DOI

EISSN

1946-0759

ISSN

1946-0740

ISBN

9781728189567

Publication Date

September 1, 2020

Volume

2020-September

Start / End Page

921 / 928