Measurement of mechanical losses in the carbon nanotube black coating of silicon wafers

Journal Article

Full Text

Duke Authors

Cited Authors

  • Prokhorov, LG; Mitrofanov, VP; Kamai, B; Markowitz, A; Ni, X; Adhikari, RX

Published Date

  • January 9, 2020

Published In

Volume / Issue

  • 37 / 1

Start / End Page

  • 015004 - 015004

Published By

Electronic International Standard Serial Number (EISSN)

  • 1361-6382

International Standard Serial Number (ISSN)

  • 0264-9381

Digital Object Identifier (DOI)

  • 10.1088/1361-6382/ab5357