A Numerical Study of Electro-migration Voiding by Evolving Level Set Functions on a Fixed Cartesian Grid
Publication
, Journal Article
Li, Z; Zhao, H; Gao, H
Published in: Journal of Computational Physics
June 1999
Duke Scholars
Published In
Journal of Computational Physics
DOI
ISSN
0021-9991
Publication Date
June 1999
Volume
152
Issue
1
Start / End Page
281 / 304
Publisher
Elsevier BV
Related Subject Headings
- Applied Mathematics
- 09 Engineering
- 02 Physical Sciences
- 01 Mathematical Sciences
Citation
APA
Chicago
ICMJE
MLA
NLM
Li, Z., Zhao, H., & Gao, H. (1999). A Numerical Study of Electro-migration Voiding by Evolving Level Set Functions on a Fixed Cartesian Grid. Journal of Computational Physics, 152(1), 281–304. https://doi.org/10.1006/jcph.1999.6249
Li, Zhilin, Hongkai Zhao, and Huajian Gao. “A Numerical Study of Electro-migration Voiding by Evolving Level Set Functions on a Fixed Cartesian Grid.” Journal of Computational Physics 152, no. 1 (June 1999): 281–304. https://doi.org/10.1006/jcph.1999.6249.
Li Z, Zhao H, Gao H. A Numerical Study of Electro-migration Voiding by Evolving Level Set Functions on a Fixed Cartesian Grid. Journal of Computational Physics. 1999 Jun;152(1):281–304.
Li, Zhilin, et al. “A Numerical Study of Electro-migration Voiding by Evolving Level Set Functions on a Fixed Cartesian Grid.” Journal of Computational Physics, vol. 152, no. 1, Elsevier BV, June 1999, pp. 281–304. Crossref, doi:10.1006/jcph.1999.6249.
Li Z, Zhao H, Gao H. A Numerical Study of Electro-migration Voiding by Evolving Level Set Functions on a Fixed Cartesian Grid. Journal of Computational Physics. Elsevier BV; 1999 Jun;152(1):281–304.
Published In
Journal of Computational Physics
DOI
ISSN
0021-9991
Publication Date
June 1999
Volume
152
Issue
1
Start / End Page
281 / 304
Publisher
Elsevier BV
Related Subject Headings
- Applied Mathematics
- 09 Engineering
- 02 Physical Sciences
- 01 Mathematical Sciences