Geoffrey D. Rubin: Critical Path Technology -- Volumetric Analyses in the Interpretation of CT Data

Journal Article

Full Text

Duke Authors

Rubin, Geoffrey D

Cited Authors

SPIE,

Published Date

March 11, 2013

Published In

Spie Newsroom

Published By

SPIE-Intl Soc Optical Eng

Electronic International Standard Serial Number (EISSN)

1818-2259

Digital Object Identifier (DOI)

10.1117/2.3201303.11