Increasing a microscope’s effective field of view via overlapped imaging and machine learning

Journal Article

We demonstrate a multi-lenses microscopic imaging system that records overlapping fields-of-view for high-efficiency automated specimen analysis. We show both in simulation and experiment how our system can achieve accurate target object detection on overlapped images.

Duke Authors

Cited Authors

  • Yao, X; Xi, H; Zhou, KC; Chaware, A; Cooke, C; Li, Y; Dunn, T; Konda, PC; Horstmeyer, R

Published Date

  • January 1, 2021

Published In

  • Optics Infobase Conference Papers

Citation Source

  • Scopus