Predicting Academic Performance during Plastic Surgery Residency: Can Step 2 Scores Reliably Replace Step 1?

Journal Article (Journal Article)

OBJECTIVE: Step 1 will transition to a pass/fail system in 2022. This study aimed to characterize the effects of this change on integrated plastic surgery program directors' selection criteria and assess whether Step 2 Clinical Knowledge (CK) can replace Step 1 as an application selection metric. DESIGN: Online survey that was administered to a collaborative group of ten plastic surgery program directors collecting USMLE Step 1, Step 2 CK, In-Service, and written board scores for 3 years of graduated integrated residents. SETTING: Ten academic integrated plastic surgery programs. PARTICIPANTS: Data from 80 graduated integrated plastic surgery residents. RESULTS: Across 80 included integrated residents, mean (SD) Step 1 score was 247 (13), Step 2 CK was 249 (13), PGY1-6 In-Service percentiles varied from 45 to 53 percentile, and written board pass rate was 98.3%. Both Step 1 and Step 2 CK correlated highly with In-Service percentiles (both p < 0.001), with Step 2 CK scores correlating similarly with In-Service performance compared to Step 1 (rho 0.359 vs. 0.355, respectively). Across applicant characteristics, program directors reported the highest relative increase in Step 2 CK importance after Step 1 transitions to pass/fail. CONCLUSIONS: Step 2 CK correlates similarly with plastic surgery In-Service performance compared to Step 1. While Step scores do not necessarily correlate with residency performance, Step 2 CK may also be used as an application screening metric for programs seeking objective data to differentiate plastic surgery applicants.

Full Text

Duke Authors

Cited Authors

  • Sergesketter, AR; Shammas, RL; Langdell, HC; Geng, Y; Eberlin, KR; Fox, P; Ko, JH; Lifchez, SD; Momoh, AO; Nguyen, V; Tenenbaum, M; Thanik, V; Phillips, BT

Published Date

  • 2022

Published In

Volume / Issue

  • 79 / 3

Start / End Page

  • 828 - 836

PubMed ID

  • 34952820

Electronic International Standard Serial Number (EISSN)

  • 1878-7452

Digital Object Identifier (DOI)

  • 10.1016/j.jsurg.2021.11.015


  • eng

Conference Location

  • United States