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DeepSIM: Deep Semantic Information-Based Automatic Mandelbug Classification

Publication ,  Journal Article
Du, X; Zheng, Z; Xiao, G; Zhou, Z; Trivedi, KS
Published in: IEEE Transactions on Reliability
December 1, 2022

Understanding and predicting types of bugs are of practical importance for developers to improve the testing efficiency and take appropriate steps to address bugs in software releases. However, due to the complex conditions under which faults manifest and the complexity of the classification rules, the automatic classification of Mandelbugs is a difficult task. In this article, we present a deep semantic information-based Mandelbug classification method that combines a semantic model with a deep learning classifier and makes use of both labeled and unlabeled bug reports. By training the bug report semantic model on millions of bug reports, each word in the text of a bug report is represented as a word embedding that preserves the semantic relationship among the words. Then, a convolutional neural network model is designed to capture the high-level features of bug reports to obtain a more accurate classification. Moreover, the effects of the semantic model size and domain on the classification results are investigated, and the quality of word embeddings is evaluated by analyzing several important parameters.

Duke Scholars

Published In

IEEE Transactions on Reliability

DOI

EISSN

1558-1721

ISSN

0018-9529

Publication Date

December 1, 2022

Volume

71

Issue

4

Start / End Page

1540 / 1554

Related Subject Headings

  • Operations Research
  • 4612 Software engineering
  • 4010 Engineering practice and education
  • 0906 Electrical and Electronic Engineering
  • 0803 Computer Software
 

Citation

APA
Chicago
ICMJE
MLA
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Du, X., Zheng, Z., Xiao, G., Zhou, Z., & Trivedi, K. S. (2022). DeepSIM: Deep Semantic Information-Based Automatic Mandelbug Classification. IEEE Transactions on Reliability, 71(4), 1540–1554. https://doi.org/10.1109/TR.2021.3110096
Du, X., Z. Zheng, G. Xiao, Z. Zhou, and K. S. Trivedi. “DeepSIM: Deep Semantic Information-Based Automatic Mandelbug Classification.” IEEE Transactions on Reliability 71, no. 4 (December 1, 2022): 1540–54. https://doi.org/10.1109/TR.2021.3110096.
Du X, Zheng Z, Xiao G, Zhou Z, Trivedi KS. DeepSIM: Deep Semantic Information-Based Automatic Mandelbug Classification. IEEE Transactions on Reliability. 2022 Dec 1;71(4):1540–54.
Du, X., et al. “DeepSIM: Deep Semantic Information-Based Automatic Mandelbug Classification.” IEEE Transactions on Reliability, vol. 71, no. 4, Dec. 2022, pp. 1540–54. Scopus, doi:10.1109/TR.2021.3110096.
Du X, Zheng Z, Xiao G, Zhou Z, Trivedi KS. DeepSIM: Deep Semantic Information-Based Automatic Mandelbug Classification. IEEE Transactions on Reliability. 2022 Dec 1;71(4):1540–1554.

Published In

IEEE Transactions on Reliability

DOI

EISSN

1558-1721

ISSN

0018-9529

Publication Date

December 1, 2022

Volume

71

Issue

4

Start / End Page

1540 / 1554

Related Subject Headings

  • Operations Research
  • 4612 Software engineering
  • 4010 Engineering practice and education
  • 0906 Electrical and Electronic Engineering
  • 0803 Computer Software