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The atomic structure and polarization of strained SrTiO3/Si

Publication ,  Journal Article
Kumah, DP; Reiner, JW; Segal, Y; Kolpak, AM; Zhang, Z; Su, D; Zhu, Y; Sawicki, MS; Broadbridge, CC; Ahn, CH; Walker, FJ
Published in: Applied Physics Letters
December 20, 2010

For thin film devices based on coupling ferroelectric polarization to charge carriers in semiconductors, the role of the interface is critical. To elucidate this role, we use synchrotron x-ray diffraction to determine the interface structure of epitaxial SrTiO3 grown on the (001) surface of Si. The average displacement of the O octahedral sublattice relative to the Sr sublattice determines the film polarization and is measured to be about 0.05 nm toward the Si, with Ti off-center displacements 0.009 nm away from the substrate. Measurements of films with different boundary conditions on the top of the SrTiO3 show that the polarization at the SrTiO3 /Si interface is dominated by oxide-Si chemical interactions. © 2010 American Institute of Physics.

Duke Scholars

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

December 20, 2010

Volume

97

Issue

25

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

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Kumah, D. P., Reiner, J. W., Segal, Y., Kolpak, A. M., Zhang, Z., Su, D., … Walker, F. J. (2010). The atomic structure and polarization of strained SrTiO3/Si. Applied Physics Letters, 97(25). https://doi.org/10.1063/1.3529460
Kumah, D. P., J. W. Reiner, Y. Segal, A. M. Kolpak, Z. Zhang, D. Su, Y. Zhu, et al. “The atomic structure and polarization of strained SrTiO3/Si.” Applied Physics Letters 97, no. 25 (December 20, 2010). https://doi.org/10.1063/1.3529460.
Kumah DP, Reiner JW, Segal Y, Kolpak AM, Zhang Z, Su D, et al. The atomic structure and polarization of strained SrTiO3/Si. Applied Physics Letters. 2010 Dec 20;97(25).
Kumah, D. P., et al. “The atomic structure and polarization of strained SrTiO3/Si.” Applied Physics Letters, vol. 97, no. 25, Dec. 2010. Scopus, doi:10.1063/1.3529460.
Kumah DP, Reiner JW, Segal Y, Kolpak AM, Zhang Z, Su D, Zhu Y, Sawicki MS, Broadbridge CC, Ahn CH, Walker FJ. The atomic structure and polarization of strained SrTiO3/Si. Applied Physics Letters. 2010 Dec 20;97(25).

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

December 20, 2010

Volume

97

Issue

25

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences