Applications of Step-Scan FT-IR Photoacoustic Depth Profiling
Publication
, Journal Article
Dittmar, RM; Palmer, RA; Chao, JL
Published in: SPIE Proceedings
1992
Duke Scholars
Published In
SPIE Proceedings
Publication Date
1992
Volume
1575
Start / End Page
197
Publisher
8th International Conference on Fourier Transform Spectroscopy, September 1991
Citation
APA
Chicago
ICMJE
MLA
NLM
Dittmar, R. M., Palmer, R. A., & Chao, J. L. (1992). Applications of Step-Scan FT-IR Photoacoustic Depth Profiling. SPIE Proceedings, 1575, 197.
Dittmar, R. M., R. A. Palmer, and J. L. Chao. “Applications of Step-Scan FT-IR Photoacoustic Depth Profiling.” SPIE Proceedings 1575 (1992): 197.
Dittmar RM, Palmer RA, Chao JL. Applications of Step-Scan FT-IR Photoacoustic Depth Profiling. SPIE Proceedings. 1992;1575:197.
Dittmar, R. M., et al. “Applications of Step-Scan FT-IR Photoacoustic Depth Profiling.” SPIE Proceedings, vol. 1575, 8th International Conference on Fourier Transform Spectroscopy, September 1991, 1992, p. 197.
Dittmar RM, Palmer RA, Chao JL. Applications of Step-Scan FT-IR Photoacoustic Depth Profiling. SPIE Proceedings. 8th International Conference on Fourier Transform Spectroscopy, September 1991; 1992;1575:197.
Published In
SPIE Proceedings
Publication Date
1992
Volume
1575
Start / End Page
197
Publisher
8th International Conference on Fourier Transform Spectroscopy, September 1991