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Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects

Publication ,  Journal Article
Baranger, HU; Wilkins, JW
Published in: Physical Review B
January 1, 1984

For a simple submicron semiconductor structure we have calculated exactly the electron distribution f(v,x) within a relaxation-to-local-equilibrium assumption for the collision term of the Boltzmann equation. This is the first calculation of the electron distribution in an inhomogeneous semiconductor. Large applied voltages produce a substantial ballistic peak in f(v,x). But at all voltages contact inhomogeneities and local heating (and cooling) produce an I-V characteristic only weakly dependent on the scattering rate. © 1984 The American Physical Society.

Duke Scholars

Published In

Physical Review B

DOI

ISSN

0163-1829

Publication Date

January 1, 1984

Volume

30

Issue

12

Start / End Page

7349 / 7351
 

Citation

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Baranger, H. U., & Wilkins, J. W. (1984). Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects. Physical Review B, 30(12), 7349–7351. https://doi.org/10.1103/PhysRevB.30.7349
Baranger, H. U., and J. W. Wilkins. “Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects.” Physical Review B 30, no. 12 (January 1, 1984): 7349–51. https://doi.org/10.1103/PhysRevB.30.7349.
Baranger HU, Wilkins JW. Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects. Physical Review B. 1984 Jan 1;30(12):7349–51.
Baranger, H. U., and J. W. Wilkins. “Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects.” Physical Review B, vol. 30, no. 12, Jan. 1984, pp. 7349–51. Scopus, doi:10.1103/PhysRevB.30.7349.
Baranger HU, Wilkins JW. Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects. Physical Review B. 1984 Jan 1;30(12):7349–7351.

Published In

Physical Review B

DOI

ISSN

0163-1829

Publication Date

January 1, 1984

Volume

30

Issue

12

Start / End Page

7349 / 7351