An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials


Journal Article

A new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed at the advanced light source (ALS). An electron mirror combined with a sophisticated magnetic beam separator is used to provide simultaneous correction of spherical and chromatic aberrations. Installed on an elliptically polarized undulator beamline, PEEM3 will be operated with very high spatial resolution and high flux to study the composition, structure, electric and magnetic properties of complex materials. © 2005 IOP Publishing Ltd.

Full Text

Duke Authors

Cited Authors

  • Feng, J; Forest, E; MacDowell, AA; Marcus, M; Padmore, H; Raoux, S; Robin, D; Scholl, A; Schlueter, R; Schmid, P; Stöhr, J; Wan, W; Wei, DH; Wu, Y

Published Date

  • April 27, 2005

Published In

Volume / Issue

  • 17 / 16

International Standard Serial Number (ISSN)

  • 0953-8984

Digital Object Identifier (DOI)

  • 10.1088/0953-8984/17/16/005

Citation Source

  • Scopus