Nanosecond-exposure electron microscopy of laser-induced phase transformations
Flash electron microscopy with exposure times of 10-20 ns was realized by installing a beam-blanking unit and a gated image intensifier in a commercial TEM. This technique was applied to laser-induced phase transitions in amorphous Ge films. Intermediate stages of explosive crystallization were visualized for the first time, such as radial growth of crystal by propagation of a mostly flat phase boundary 100-600 ns after the laser pulse, succeeded by a helical growth after a delay of 1.5 μs. Three mechanisms responsible for the removal of material during perforation of the film, i.e. film flow, evaporation and explosive fragmentation, were also visualized. © 1987.
Bostanjoglo, O; Tornow, RP; Tornow, W
Volume / Issue
Start / End Page
International Standard Serial Number (ISSN)
Digital Object Identifier (DOI)