Nanosecond transmission electron microscopy and diffraction

Published

Journal Article

A conventional TEM was extended to a time-resolving instrument by installing a pulsed microchannel plate as a low-cost time-resolving image detector and a pulsed electron beam shutter. The technique provides electron micrographs and diffraction pictures of non-recurring events on the nanosecond/micrometre scale within a commercial TEM.

Full Text

Duke Authors

Cited Authors

  • Bostanjoglo, O; Tornow, RP; Tornow, W

Published Date

  • December 1, 1987

Published In

Volume / Issue

  • 20 / 5

Start / End Page

  • 556 - 557

International Standard Serial Number (ISSN)

  • 0022-3735

Digital Object Identifier (DOI)

  • 10.1088/0022-3735/20/5/018

Citation Source

  • Scopus