Magnetic nanowire based high resolution magnetic force microscope probes

Published

Journal Article

We report an efficient process for controlled fabrication of high-resolution magnetic force microscope probes using preformed magnetic nanowires. Nickel and cobalt nanowires produced by electrodeposition were directly assembled onto the tip of a commercial atomic force microscope cantilever with controlled orientation and length by dielectrophoresis. The properties of these nanowire-based probes are characterized. © 2005 American Institute of Physics.

Full Text

Duke Authors

Cited Authors

  • Yang, G; Tang, J; Kato, S; Zhang, Q; Qin, LC; Woodson, M; Liu, J; Kim, JW; Littlehei, PT; Park, C; Zhou, O

Published Date

  • September 19, 2005

Published In

Volume / Issue

  • 87 / 12

Start / End Page

  • 1 - 3

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.2043237

Citation Source

  • Scopus