Magnetic nanowire based high resolution magnetic force microscope probes
Journal Article (Journal Article)
We report an efficient process for controlled fabrication of high-resolution magnetic force microscope probes using preformed magnetic nanowires. Nickel and cobalt nanowires produced by electrodeposition were directly assembled onto the tip of a commercial atomic force microscope cantilever with controlled orientation and length by dielectrophoresis. The properties of these nanowire-based probes are characterized. © 2005 American Institute of Physics.
Full Text
Duke Authors
Cited Authors
- Yang, G; Tang, J; Kato, S; Zhang, Q; Qin, LC; Woodson, M; Liu, J; Kim, JW; Littlehei, PT; Park, C; Zhou, O
Published Date
- September 19, 2005
Published In
Volume / Issue
- 87 / 12
Start / End Page
- 1 - 3
International Standard Serial Number (ISSN)
- 0003-6951
Digital Object Identifier (DOI)
- 10.1063/1.2043237
Citation Source
- Scopus