Battery of neurobehavioral tests recommended to ATSDR: solvent-induced deficits in microelectronic workers.

Published

Journal Article (Review)

Full Text

Duke Authors

Cited Authors

  • Hudnell, HK; Boyes, WK; Otto, DA; House, DE; Creason, JP; Geller, AM; Darcey, DJ; Broadwell, DK

Published Date

  • March 1996

Published In

Volume / Issue

  • 12 / 2

Start / End Page

  • 235 - 243

PubMed ID

  • 8794536

Pubmed Central ID

  • 8794536

International Standard Serial Number (ISSN)

  • 0748-2337

Language

  • eng

Conference Location

  • England