Summary Abstract: Correlation between Schottky barrier height and phase stoichiometry/structure of silicide–silicon interfaces

Published

Journal Article

Full Text

Duke Authors

Cited Authors

  • Schmid, PE; Ho, PS; Tan, TY

Published Date

  • March 1, 1982

Published In

Volume / Issue

  • 20 / 3

Start / End Page

  • 688 - 689

Published By

International Standard Serial Number (ISSN)

  • 0022-5355

Digital Object Identifier (DOI)

  • 10.1116/1.571629

Language

  • en