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Model of partitioning of point defect species during precipitation of a misfitting compound in Czochralski silicon

Publication ,  Journal Article
Huh, JY; Tan, TY; Gösele, U
Published in: Journal of Applied Physics
December 1, 1995

The partitioning of point defect species during diffusion controlled precipitation of a misfitting compound in Czochralski silicon is studied using the principle of maximum degradation rate of the total system free energy. The degradation rate of the system free energy is obtained from the entropy production due to mass diffusion in the matrix. The results are then compared with those obtained using the principle of maximum growth rate. It is shown that, for a precipitation process involving more than one chemical or structural component species with their concentrations deviating from the appropriate thermal equilibrium values, the maximum growth rate description does not generally correspond to that of the maximum degradation rate of the system free energy. The results are then applied to oxygen precipitation in silicon, showing some equilibrium characteristics pertinent to a multicomponent system with intrinsic point defects acting as pseudocomponents. It is also shown that, depending on the intrinsic point defect concentrations at the far field of diffusion, the oxide precipitate can grow either by emitting or by absorbing both vacancies and Si self-interstitials. © 1995 American Institute of Physics.

Duke Scholars

Published In

Journal of Applied Physics

DOI

ISSN

0021-8979

Publication Date

December 1, 1995

Volume

77

Issue

11

Start / End Page

5563 / 5571

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 49 Mathematical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences
  • 01 Mathematical Sciences
 

Citation

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Huh, J. Y., Tan, T. Y., & Gösele, U. (1995). Model of partitioning of point defect species during precipitation of a misfitting compound in Czochralski silicon. Journal of Applied Physics, 77(11), 5563–5571. https://doi.org/10.1063/1.359197
Huh, J. Y., T. Y. Tan, and U. Gösele. “Model of partitioning of point defect species during precipitation of a misfitting compound in Czochralski silicon.” Journal of Applied Physics 77, no. 11 (December 1, 1995): 5563–71. https://doi.org/10.1063/1.359197.
Huh JY, Tan TY, Gösele U. Model of partitioning of point defect species during precipitation of a misfitting compound in Czochralski silicon. Journal of Applied Physics. 1995 Dec 1;77(11):5563–71.
Huh, J. Y., et al. “Model of partitioning of point defect species during precipitation of a misfitting compound in Czochralski silicon.” Journal of Applied Physics, vol. 77, no. 11, Dec. 1995, pp. 5563–71. Scopus, doi:10.1063/1.359197.
Huh JY, Tan TY, Gösele U. Model of partitioning of point defect species during precipitation of a misfitting compound in Czochralski silicon. Journal of Applied Physics. 1995 Dec 1;77(11):5563–5571.
Journal cover image

Published In

Journal of Applied Physics

DOI

ISSN

0021-8979

Publication Date

December 1, 1995

Volume

77

Issue

11

Start / End Page

5563 / 5571

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 49 Mathematical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences
  • 01 Mathematical Sciences