DETECTION OF THE PERIODIC STRUCTURE OF HIGH-ANGLE TWIST BOUNDARIES - 2. HIGH RESOLUTION ELECTRON MICROSCOPY STUDY.
High-resolution electron microscopy was used to image directly the 0-lattice of certain twist boundaries with misorientations up to 25 degree and 0-lattice spacings as small as 7 A. The results were entirely consistent with the conclusions reached on the basis of the diffraction experiments described in Part I. An experimental method was devised for determining whether the 0-lattice was imaged by conventional diffraction strain contrast or by interference strain contrast which arises from interference between f. c. c. and 0-reflections resulting from the periodic structure of the boundary. Efforts were also made to detect secondary grain boundary dislocation networks.