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The dependence of the texture of tellurium thin films on vacuum deposition angle

Publication ,  Journal Article
Cocks, FH; Peterson, MJ; Jones, PL
Published in: Thin Solid Films
January 1, 1980

Vacuum-deposited tellurium thin films can show substantially different surface morphologies depending on the angle with which the vapor stream impinges on the substrate surface. These tellurium thin films have a tendency to grow as acicular crystallites but as the deposition angle is increased so that the vapor stream becomes tangetial to the substrate surface the spacing between crystallites increase and approaches, at stream angles of approximately 80° from the normal, dimensions roughly once or twice the average wavelength of visible light. Such films may have application in solar energy collector systems because of the high absorptivity of sunlight shown by such films. Mechanisms which describe the tendency for crystallite spacing to increase with increasing angle are discussed. © 1980, All rights reserved.

Duke Scholars

Published In

Thin Solid Films

DOI

ISSN

0040-6090

Publication Date

January 1, 1980

Volume

70

Issue

2

Start / End Page

297 / 301

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Cocks, F. H., Peterson, M. J., & Jones, P. L. (1980). The dependence of the texture of tellurium thin films on vacuum deposition angle. Thin Solid Films, 70(2), 297–301. https://doi.org/10.1016/0040-6090(80)90369-7
Cocks, F. H., M. J. Peterson, and P. L. Jones. “The dependence of the texture of tellurium thin films on vacuum deposition angle.” Thin Solid Films 70, no. 2 (January 1, 1980): 297–301. https://doi.org/10.1016/0040-6090(80)90369-7.
Cocks FH, Peterson MJ, Jones PL. The dependence of the texture of tellurium thin films on vacuum deposition angle. Thin Solid Films. 1980 Jan 1;70(2):297–301.
Cocks, F. H., et al. “The dependence of the texture of tellurium thin films on vacuum deposition angle.” Thin Solid Films, vol. 70, no. 2, Jan. 1980, pp. 297–301. Scopus, doi:10.1016/0040-6090(80)90369-7.
Cocks FH, Peterson MJ, Jones PL. The dependence of the texture of tellurium thin films on vacuum deposition angle. Thin Solid Films. 1980 Jan 1;70(2):297–301.
Journal cover image

Published In

Thin Solid Films

DOI

ISSN

0040-6090

Publication Date

January 1, 1980

Volume

70

Issue

2

Start / End Page

297 / 301

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences