The dependence of the texture of tellurium thin films on vacuum deposition angle


Journal Article

Vacuum-deposited tellurium thin films can show substantially different surface morphologies depending on the angle with which the vapor stream impinges on the substrate surface. These tellurium thin films have a tendency to grow as acicular crystallites but as the deposition angle is increased so that the vapor stream becomes tangetial to the substrate surface the spacing between crystallites increase and approaches, at stream angles of approximately 80° from the normal, dimensions roughly once or twice the average wavelength of visible light. Such films may have application in solar energy collector systems because of the high absorptivity of sunlight shown by such films. Mechanisms which describe the tendency for crystallite spacing to increase with increasing angle are discussed. © 1980, All rights reserved.

Full Text

Duke Authors

Cited Authors

  • Cocks, FH; Peterson, MJ; Jones, PL

Published Date

  • January 1, 1980

Published In

Volume / Issue

  • 70 / 2

Start / End Page

  • 297 - 301

International Standard Serial Number (ISSN)

  • 0040-6090

Digital Object Identifier (DOI)

  • 10.1016/0040-6090(80)90369-7

Citation Source

  • Scopus