Total external X-ray reflection: A novel method of surface chemical analysis
Publication
, Journal Article
Cocks, FH; Gettliffe, R
Published in: Materials Letters
January 1, 1985
Reflected X-ray intensity as a function of angle near the critical angle for total external reflection is used to determine the surface composition of amorphous Se-Te thin films. With the choice of appropriate wavelengths, the method is applicable to a wide variety of amorphous or crystalline films. © 1985.
Duke Scholars
Published In
Materials Letters
DOI
ISSN
0167-577X
Publication Date
January 1, 1985
Volume
3
Issue
4
Start / End Page
133 / 136
Related Subject Headings
- Materials
- 51 Physical sciences
- 40 Engineering
- 34 Chemical sciences
- 09 Engineering
- 03 Chemical Sciences
- 02 Physical Sciences
Citation
APA
Chicago
ICMJE
MLA
NLM
Cocks, F. H., & Gettliffe, R. (1985). Total external X-ray reflection: A novel method of surface chemical analysis. Materials Letters, 3(4), 133–136. https://doi.org/10.1016/0167-577X(85)90144-2
Cocks, F. H., and R. Gettliffe. “Total external X-ray reflection: A novel method of surface chemical analysis.” Materials Letters 3, no. 4 (January 1, 1985): 133–36. https://doi.org/10.1016/0167-577X(85)90144-2.
Cocks FH, Gettliffe R. Total external X-ray reflection: A novel method of surface chemical analysis. Materials Letters. 1985 Jan 1;3(4):133–6.
Cocks, F. H., and R. Gettliffe. “Total external X-ray reflection: A novel method of surface chemical analysis.” Materials Letters, vol. 3, no. 4, Jan. 1985, pp. 133–36. Scopus, doi:10.1016/0167-577X(85)90144-2.
Cocks FH, Gettliffe R. Total external X-ray reflection: A novel method of surface chemical analysis. Materials Letters. 1985 Jan 1;3(4):133–136.
Published In
Materials Letters
DOI
ISSN
0167-577X
Publication Date
January 1, 1985
Volume
3
Issue
4
Start / End Page
133 / 136
Related Subject Headings
- Materials
- 51 Physical sciences
- 40 Engineering
- 34 Chemical sciences
- 09 Engineering
- 03 Chemical Sciences
- 02 Physical Sciences