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Total external X-ray reflection: A novel method of surface chemical analysis

Publication ,  Journal Article
Cocks, FH; Gettliffe, R
Published in: Materials Letters
January 1, 1985

Reflected X-ray intensity as a function of angle near the critical angle for total external reflection is used to determine the surface composition of amorphous Se-Te thin films. With the choice of appropriate wavelengths, the method is applicable to a wide variety of amorphous or crystalline films. © 1985.

Duke Scholars

Published In

Materials Letters

DOI

ISSN

0167-577X

Publication Date

January 1, 1985

Volume

3

Issue

4

Start / End Page

133 / 136

Related Subject Headings

  • Materials
  • 51 Physical sciences
  • 40 Engineering
  • 34 Chemical sciences
  • 09 Engineering
  • 03 Chemical Sciences
  • 02 Physical Sciences
 

Citation

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Cocks, F. H., & Gettliffe, R. (1985). Total external X-ray reflection: A novel method of surface chemical analysis. Materials Letters, 3(4), 133–136. https://doi.org/10.1016/0167-577X(85)90144-2
Cocks, F. H., and R. Gettliffe. “Total external X-ray reflection: A novel method of surface chemical analysis.” Materials Letters 3, no. 4 (January 1, 1985): 133–36. https://doi.org/10.1016/0167-577X(85)90144-2.
Cocks FH, Gettliffe R. Total external X-ray reflection: A novel method of surface chemical analysis. Materials Letters. 1985 Jan 1;3(4):133–6.
Cocks, F. H., and R. Gettliffe. “Total external X-ray reflection: A novel method of surface chemical analysis.” Materials Letters, vol. 3, no. 4, Jan. 1985, pp. 133–36. Scopus, doi:10.1016/0167-577X(85)90144-2.
Cocks FH, Gettliffe R. Total external X-ray reflection: A novel method of surface chemical analysis. Materials Letters. 1985 Jan 1;3(4):133–136.
Journal cover image

Published In

Materials Letters

DOI

ISSN

0167-577X

Publication Date

January 1, 1985

Volume

3

Issue

4

Start / End Page

133 / 136

Related Subject Headings

  • Materials
  • 51 Physical sciences
  • 40 Engineering
  • 34 Chemical sciences
  • 09 Engineering
  • 03 Chemical Sciences
  • 02 Physical Sciences