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Tomographic processing on wireless ground sensor networks

Publication ,  Journal Article
Rittgers, AM; Morrison, RL; Stack, RA; Brady, DJ
Published in: Proceedings of SPIE - The International Society for Optical Engineering
December 1, 2001

New opportunities for battlefield surveillance and modeling are unfolding with the advent of smart sensors linked via digital wireless networks. One exciting prospect is the use of tomographic techniques in order to create real-time three-dimensional modeling and analysis of the environment that is immediately accessible to battlefield forces. We have developed a small-scale ground sensor network for this application. We discuss initial deployment of this network as a tracking system.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 2001

Volume

4393

Start / End Page

122 / 128
 

Citation

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Rittgers, A. M., Morrison, R. L., Stack, R. A., & Brady, D. J. (2001). Tomographic processing on wireless ground sensor networks. Proceedings of SPIE - The International Society for Optical Engineering, 4393, 122–128. https://doi.org/10.1117/12.441261
Rittgers, A. M., R. L. Morrison, R. A. Stack, and D. J. Brady. “Tomographic processing on wireless ground sensor networks.” Proceedings of SPIE - The International Society for Optical Engineering 4393 (December 1, 2001): 122–28. https://doi.org/10.1117/12.441261.
Rittgers AM, Morrison RL, Stack RA, Brady DJ. Tomographic processing on wireless ground sensor networks. Proceedings of SPIE - The International Society for Optical Engineering. 2001 Dec 1;4393:122–8.
Rittgers, A. M., et al. “Tomographic processing on wireless ground sensor networks.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 4393, Dec. 2001, pp. 122–28. Scopus, doi:10.1117/12.441261.
Rittgers AM, Morrison RL, Stack RA, Brady DJ. Tomographic processing on wireless ground sensor networks. Proceedings of SPIE - The International Society for Optical Engineering. 2001 Dec 1;4393:122–128.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 2001

Volume

4393

Start / End Page

122 / 128