Tomographic processing on wireless ground sensor networks
Publication
, Journal Article
Rittgers, AM; Morrison, RL; Stack, RA; Brady, DJ
Published in: Proceedings of SPIE - The International Society for Optical Engineering
December 1, 2001
New opportunities for battlefield surveillance and modeling are unfolding with the advent of smart sensors linked via digital wireless networks. One exciting prospect is the use of tomographic techniques in order to create real-time three-dimensional modeling and analysis of the environment that is immediately accessible to battlefield forces. We have developed a small-scale ground sensor network for this application. We discuss initial deployment of this network as a tracking system.
Duke Scholars
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
ISSN
0277-786X
Publication Date
December 1, 2001
Volume
4393
Start / End Page
122 / 128
Citation
APA
Chicago
ICMJE
MLA
NLM
Rittgers, A. M., Morrison, R. L., Stack, R. A., & Brady, D. J. (2001). Tomographic processing on wireless ground sensor networks. Proceedings of SPIE - The International Society for Optical Engineering, 4393, 122–128. https://doi.org/10.1117/12.441261
Rittgers, A. M., R. L. Morrison, R. A. Stack, and D. J. Brady. “Tomographic processing on wireless ground sensor networks.” Proceedings of SPIE - The International Society for Optical Engineering 4393 (December 1, 2001): 122–28. https://doi.org/10.1117/12.441261.
Rittgers AM, Morrison RL, Stack RA, Brady DJ. Tomographic processing on wireless ground sensor networks. Proceedings of SPIE - The International Society for Optical Engineering. 2001 Dec 1;4393:122–8.
Rittgers, A. M., et al. “Tomographic processing on wireless ground sensor networks.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 4393, Dec. 2001, pp. 122–28. Scopus, doi:10.1117/12.441261.
Rittgers AM, Morrison RL, Stack RA, Brady DJ. Tomographic processing on wireless ground sensor networks. Proceedings of SPIE - The International Society for Optical Engineering. 2001 Dec 1;4393:122–128.
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
ISSN
0277-786X
Publication Date
December 1, 2001
Volume
4393
Start / End Page
122 / 128