Standoff raman spectroscopy system for remote chemical detection
Publication
, Journal Article
Cull, EC; Gehm, ME; Guenther, BD; Brady, DJ
Published in: Proceedings of SPIE - The International Society for Optical Engineering
2005
We have developed a class of aperture coding schemes for Remote Raman Spectrometers (RRS) that remove the traditional trade-off between throughput and spectral resolution. As a result, the size of the remote interrogation region can be driven by operational, rather than optical considerations. In this paper we present the design of our coded-aperture standoff spectroscopy system as well as experimental data collected while making remote measurements.
Duke Scholars
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
Publication Date
2005
Volume
5994
Start / End Page
59940
Location
Boston, MA, United States
Citation
APA
Chicago
ICMJE
MLA
NLM
Cull, E. C., Gehm, M. E., Guenther, B. D., & Brady, D. J. (2005). Standoff raman spectroscopy system for remote chemical detection. Proceedings of SPIE - The International Society for Optical Engineering, 5994, 59940. https://doi.org/10.1117/12.626170
Cull, E. C., M. E. Gehm, B. D. Guenther, and D. J. Brady. “Standoff raman spectroscopy system for remote chemical detection.” Proceedings of SPIE - The International Society for Optical Engineering 5994 (2005): 59940. https://doi.org/10.1117/12.626170.
Cull EC, Gehm ME, Guenther BD, Brady DJ. Standoff raman spectroscopy system for remote chemical detection. Proceedings of SPIE - The International Society for Optical Engineering. 2005;5994:59940.
Cull, E. C., et al. “Standoff raman spectroscopy system for remote chemical detection.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 5994, 2005, p. 59940. Manual, doi:10.1117/12.626170.
Cull EC, Gehm ME, Guenther BD, Brady DJ. Standoff raman spectroscopy system for remote chemical detection. Proceedings of SPIE - The International Society for Optical Engineering. 2005;5994:59940.
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
Publication Date
2005
Volume
5994
Start / End Page
59940
Location
Boston, MA, United States