Full-field swept-source phase microscopy.

Published

Journal Article

We present a full-field phase microscopy technique for quantitative nanoscale surface profiling of samples in reflection. This technique utilizes swept-source optical coherence tomography in a full-field common path interferometer for phase-stable cross-sectional acquisition without scanning. Subwavelength variations in surface sample features are measured without interference from spurious reflections by processing the interferometric phase at a selected depth plane, providing a 1.3 nm stability for high signal-to-noise ratio surface features. Nanoscale imaging was demonstrated by measuring the location of receptor sites on a DNA assay biochip and the surface topography of erythrocytes in a blood smear.

Full Text

Duke Authors

Cited Authors

  • Sarunic, MV; Weinberg, S; Izatt, JA

Published Date

  • May 2006

Published In

Volume / Issue

  • 31 / 10

Start / End Page

  • 1462 - 1464

PubMed ID

  • 16642139

Pubmed Central ID

  • 16642139

Electronic International Standard Serial Number (EISSN)

  • 1539-4794

International Standard Serial Number (ISSN)

  • 0146-9592

Digital Object Identifier (DOI)

  • 10.1364/ol.31.001462

Language

  • eng