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Interferometric phase-based dual wavelength tomography

Publication ,  Journal Article
Yang, C; Wax, A; Dasari, RR; Feld, MS
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 2001

We describe our phase-sensitive interferometry technique implemented as phase dispersion microscopy (PDM)/optical tomography (PDOT). The technique is based on measuring the phase difference between fundamental and second harmonic low coherence light in a novel interferometer. We attain high sensitivity to subtle refractive index differences due to dispersion with a differential optical path sensitivity of 5 nm. Using PDM, we show that ballistic light in a turbid medium undergoes a phase velocity change that is dependent on scatterer size. We demonstrate that the microscopy technique performs better than a conventional phase contrast microscope in imaging dispersive and weakly scattering samples. The tomographic implementation of the technique (PDOT) can complement Optical Coherence Tomography (OCT) by providing phase information about the scanned object.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

January 1, 2001

Volume

4251

Start / End Page

63 / 70
 

Citation

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Yang, C., Wax, A., Dasari, R. R., & Feld, M. S. (2001). Interferometric phase-based dual wavelength tomography. Proceedings of SPIE - The International Society for Optical Engineering, 4251, 63–70. https://doi.org/10.1117/12.427872
Yang, C., A. Wax, R. R. Dasari, and M. S. Feld. “Interferometric phase-based dual wavelength tomography.” Proceedings of SPIE - The International Society for Optical Engineering 4251 (January 1, 2001): 63–70. https://doi.org/10.1117/12.427872.
Yang C, Wax A, Dasari RR, Feld MS. Interferometric phase-based dual wavelength tomography. Proceedings of SPIE - The International Society for Optical Engineering. 2001 Jan 1;4251:63–70.
Yang, C., et al. “Interferometric phase-based dual wavelength tomography.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 4251, Jan. 2001, pp. 63–70. Scopus, doi:10.1117/12.427872.
Yang C, Wax A, Dasari RR, Feld MS. Interferometric phase-based dual wavelength tomography. Proceedings of SPIE - The International Society for Optical Engineering. 2001 Jan 1;4251:63–70.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

January 1, 2001

Volume

4251

Start / End Page

63 / 70