Interferometric phase-based dual wavelength tomography

Published

Journal Article

We describe our phase-sensitive interferometry technique implemented as phase dispersion microscopy (PDM)/optical tomography (PDOT). The technique is based on measuring the phase difference between fundamental and second harmonic low coherence light in a novel interferometer. We attain high sensitivity to subtle refractive index differences due to dispersion with a differential optical path sensitivity of 5 nm. Using PDM, we show that ballistic light in a turbid medium undergoes a phase velocity change that is dependent on scatterer size. We demonstrate that the microscopy technique performs better than a conventional phase contrast microscope in imaging dispersive and weakly scattering samples. The tomographic implementation of the technique (PDOT) can complement Optical Coherence Tomography (OCT) by providing phase information about the scanned object.

Full Text

Duke Authors

Cited Authors

  • Yang, C; Wax, A; Dasari, RR; Feld, MS

Published Date

  • January 1, 2001

Published In

Volume / Issue

  • 4251 /

Start / End Page

  • 63 - 70

International Standard Serial Number (ISSN)

  • 0277-786X

Digital Object Identifier (DOI)

  • 10.1117/12.427872

Citation Source

  • Scopus