Skip to main content
Journal cover image

Rapid, depth-resolved light scattering measurements using Fourier domain, angle-resolved low coherence interferometry.

Publication ,  Journal Article
Pyhtila, JW; Wax, A
Published in: Optics express
December 2004

We present a novel angle-resolved low coherence interferometry scheme for rapid measurement of depth-resolved angular scattering distributions to enable determination of scatterer size via elastic scattering properties. Depth resolution is achieved using a superluminescent diode in a modified Mach-Zehnder interferometer with the mixed signal and reference fields dispersed by an imaging spectrograph. The spectrograph slit is located in a Fourier transform plane of the scattering sample, enabling angle-resolved measurements over a 0.21 radian range. The capabilities of the new technique are demonstrated by recording the distribution of light scattered by a sub-surface layer of polystyrene microspheres in 40 milliseconds. The data are used to determine the microsphere size with good accuracy. Future clinical application to measuring the size of cell nuclei in living epithelial tissues using backscattered light is discussed.

Duke Scholars

Altmetric Attention Stats
Dimensions Citation Stats

Published In

Optics express

DOI

EISSN

1094-4087

ISSN

1094-4087

Publication Date

December 2004

Volume

12

Issue

25

Start / End Page

6178 / 6183

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Pyhtila, J. W., & Wax, A. (2004). Rapid, depth-resolved light scattering measurements using Fourier domain, angle-resolved low coherence interferometry. Optics Express, 12(25), 6178–6183. https://doi.org/10.1364/opex.12.006178
Pyhtila, John W., and Adam Wax. “Rapid, depth-resolved light scattering measurements using Fourier domain, angle-resolved low coherence interferometry.Optics Express 12, no. 25 (December 2004): 6178–83. https://doi.org/10.1364/opex.12.006178.
Pyhtila, John W., and Adam Wax. “Rapid, depth-resolved light scattering measurements using Fourier domain, angle-resolved low coherence interferometry.Optics Express, vol. 12, no. 25, Dec. 2004, pp. 6178–83. Epmc, doi:10.1364/opex.12.006178.
Journal cover image

Published In

Optics express

DOI

EISSN

1094-4087

ISSN

1094-4087

Publication Date

December 2004

Volume

12

Issue

25

Start / End Page

6178 / 6183

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics