Interferometric phase-dispersion microscopy


Journal Article

We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples. © 2000 Optical Society of America.

Full Text

Duke Authors

Cited Authors

  • Yang, C; Wax, A; Georgakoudi, I; Hanlon, EB; Badizadegan, K; Dasari, RR; Feld, MS

Published Date

  • October 15, 2000

Published In

Volume / Issue

  • 25 / 20

Start / End Page

  • 1526 - 1528

International Standard Serial Number (ISSN)

  • 0146-9592

Digital Object Identifier (DOI)

  • 10.1364/OL.25.001526

Citation Source

  • Scopus