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Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices

Publication ,  Journal Article
Losurdo, M; Giuva, D; Giangregorio, MM; Bruno, G; Brown, AS
Published in: Thin Solid Films
May 1, 2004

Pseudodielectric function spectra of GaAs/GaSb1-yAsy, GaSb/GaAsySb1-y and GaAs/GaPyAs1-y superlattices have been measured by spectroscopic ellipsometry in the 0.75-5.5 eV photon energy range. The analysis of the E1 interband critical point and modeling of spectra has been carried out to investigate the chemistry of the anion exchange reaction and abruptness of interface composition in the superlattices. It has been found that a ternary compound GaPyAs 1-y forms in the case of the P-for-As anion exchange reaction. In the case of As-for-Sb anion exchange reaction for (GaSb/GaAsySb 1-y)20 SLs, SE data show that this anion exchange results in the formation not only of a ternary alloy GaAsySb1-y, but also in the formation of isoelectronic compounds AsSbx that segregate at the GaSb/GaAs interface. In the case of Sb-for-As anion exchange for (GaAs/GaSbyAs1-y)20 SLs, Sb segregates at the GaAs surface. © 2003 Elsevier B.V. All rights reserved.

Duke Scholars

Published In

Thin Solid Films

DOI

ISSN

0040-6090

Publication Date

May 1, 2004

Volume

455-456

Start / End Page

457 / 461

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Losurdo, M., Giuva, D., Giangregorio, M. M., Bruno, G., & Brown, A. S. (2004). Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices. Thin Solid Films, 455456, 457–461. https://doi.org/10.1016/j.tsf.2003.11.286
Losurdo, M., D. Giuva, M. M. Giangregorio, G. Bruno, and A. S. Brown. “Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices.” Thin Solid Films 455–456 (May 1, 2004): 457–61. https://doi.org/10.1016/j.tsf.2003.11.286.
Losurdo M, Giuva D, Giangregorio MM, Bruno G, Brown AS. Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices. Thin Solid Films. 2004 May 1;455–456:457–61.
Losurdo, M., et al. “Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices.” Thin Solid Films, vol. 455–456, May 2004, pp. 457–61. Scopus, doi:10.1016/j.tsf.2003.11.286.
Losurdo M, Giuva D, Giangregorio MM, Bruno G, Brown AS. Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices. Thin Solid Films. 2004 May 1;455–456:457–461.
Journal cover image

Published In

Thin Solid Films

DOI

ISSN

0040-6090

Publication Date

May 1, 2004

Volume

455-456

Start / End Page

457 / 461

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences