Mode Conversion and Leaky-Wave Excitation at Open-End Coupled-Microstrip Discontinuities


Journal Article

The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupledmicrostrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that dominant leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and for some examples it is shown that inclusion of a complete-domain basis function for the leaky mode improves numerical stability dramatically. © 1995 IEEE

Full Text

Duke Authors

Cited Authors

  • Cina, JL; Carin, L

Published Date

  • January 1, 1995

Published In

Volume / Issue

  • 43 / 9

Start / End Page

  • 2066 - 2072

Electronic International Standard Serial Number (EISSN)

  • 1557-9670

International Standard Serial Number (ISSN)

  • 0018-9480

Digital Object Identifier (DOI)

  • 10.1109/22.414542

Citation Source

  • Scopus