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Determination of mechanical and electronic shifts for pinhole SPECT using a single point source.

Publication ,  Journal Article
Metzler, SD; Greer, KL; Jaszczak, RJ
Published in: IEEE Trans Med Imaging
March 2005

The effects of uncompensated electronic and mechanical shifts may compromise the resolution of pinhole single photon emission computed tomography. The resolution degradation due to uncompensated shifts is estimated through simulated data. A method for determining the transverse mechanical and axial electronic shifts is described and evaluated. This method assumes that the tilt of the detector and the radius of rotation (ROR) are previously determined using another method. When this assumption is made, it is possible to determine the rest of the calibration parameters using a single point source. A method that determines the electronic and mechanical shifts as well as the tilt has been previously described; this method requires three point sources. It may be reasonable in most circumstances to calibrate tilt much less frequently than the mechanical shifts since the tilt is a property of the scanner whereas the mechanical shift may change every time the collimator is replaced. An alternative method for determining the ROR may also be used. Lastly, we take the view that the transverse electronic shift and the focal length change slowly and find these parameters independently.

Duke Scholars

Published In

IEEE Trans Med Imaging

DOI

ISSN

0278-0062

Publication Date

March 2005

Volume

24

Issue

3

Start / End Page

361 / 370

Location

United States

Related Subject Headings

  • Tomography, Emission-Computed, Single-Photon
  • Sensitivity and Specificity
  • Reproducibility of Results
  • Phantoms, Imaging
  • Nuclear Medicine & Medical Imaging
  • Mechanics
  • Imaging, Three-Dimensional
  • Image Interpretation, Computer-Assisted
  • Image Enhancement
  • Equipment Failure Analysis
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Metzler, S. D., Greer, K. L., & Jaszczak, R. J. (2005). Determination of mechanical and electronic shifts for pinhole SPECT using a single point source. IEEE Trans Med Imaging, 24(3), 361–370. https://doi.org/10.1109/tmi.2004.842456
Metzler, S. D., K. L. Greer, and R. J. Jaszczak. “Determination of mechanical and electronic shifts for pinhole SPECT using a single point source.IEEE Trans Med Imaging 24, no. 3 (March 2005): 361–70. https://doi.org/10.1109/tmi.2004.842456.
Metzler SD, Greer KL, Jaszczak RJ. Determination of mechanical and electronic shifts for pinhole SPECT using a single point source. IEEE Trans Med Imaging. 2005 Mar;24(3):361–70.
Metzler, S. D., et al. “Determination of mechanical and electronic shifts for pinhole SPECT using a single point source.IEEE Trans Med Imaging, vol. 24, no. 3, Mar. 2005, pp. 361–70. Pubmed, doi:10.1109/tmi.2004.842456.
Metzler SD, Greer KL, Jaszczak RJ. Determination of mechanical and electronic shifts for pinhole SPECT using a single point source. IEEE Trans Med Imaging. 2005 Mar;24(3):361–370.

Published In

IEEE Trans Med Imaging

DOI

ISSN

0278-0062

Publication Date

March 2005

Volume

24

Issue

3

Start / End Page

361 / 370

Location

United States

Related Subject Headings

  • Tomography, Emission-Computed, Single-Photon
  • Sensitivity and Specificity
  • Reproducibility of Results
  • Phantoms, Imaging
  • Nuclear Medicine & Medical Imaging
  • Mechanics
  • Imaging, Three-Dimensional
  • Image Interpretation, Computer-Assisted
  • Image Enhancement
  • Equipment Failure Analysis