Direct measurement of near-band-gap electrorefraction in Al 0.3Ga0.7As/GaAs/Al0.3Ga0.7As thin-film structures
Journal Article (Journal Article)
We report the first direct measurement of near-band-gap Franz-Keldysh electrorefraction in Al0.3Ga0.7As/GaAs/Al 0.3Ga0.7As p-i-n single-crystal thin-film Fabry-Perot structures with semitransparent metallic mirror contacts. These measurements are performed for various reverse biases and at photon energies ranging from 9 to less than 1 meV from the GaAs band edge. The measured refractive index variation is several times larger than that predicted by the effective mass approximation theory.
Full Text
Duke Authors
Cited Authors
- Calhoun, KH; Jokerst, NM
Published Date
- December 1, 1993
Published In
Volume / Issue
- 62 / 21
Start / End Page
- 2673 - 2675
International Standard Serial Number (ISSN)
- 0003-6951
Digital Object Identifier (DOI)
- 10.1063/1.109281
Citation Source
- Scopus