Integrated thin film photodetectors with vertically coupled microring resonators for chip scale spectral analysis

Journal Article

An integrated spectral analysis system using a thin film InGaAs metal-semiconductor-metal photodetector integrated with a vertically coupled polymer microring resonator was demonstrated for chip scale implementation. The integrated spectral analysis system has an excellent selectivity in measured spectral response as well as low dark current (3.2 nA). The measured full width half maximum of the spectral photoresponse at 5 V was 0.5 nm. © 2007 American Institute of Physics.

Full Text

Duke Authors

Cited Authors

  • Cho, S-Y; Jokerst, NM

Published Date

  • 2007

Published In

Volume / Issue

  • 90 / 10

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.2711524