Microstructural characterization of diamond thin films
Publication
, Journal Article
Williams, BE; Glass, JT; Davis, RF; Kobashi, K; More, KL
Published in: Proceedings - The Electrochemical Society
1989
Duke Scholars
Published In
Proceedings - The Electrochemical Society
Publication Date
1989
Volume
89
Issue
12
Start / End Page
202
Location
Los Angeles, CA, USA
Citation
APA
Chicago
ICMJE
MLA
NLM
Williams, B. E., Glass, J. T., Davis, R. F., Kobashi, K., & More, K. L. (1989). Microstructural characterization of diamond thin films. Proceedings - The Electrochemical Society, 89(12), 202.
Williams, B. E., J. T. Glass, R. F. Davis, K. Kobashi, and K. L. More. “Microstructural characterization of diamond thin films.” Proceedings - The Electrochemical Society 89, no. 12 (1989): 202.
Williams BE, Glass JT, Davis RF, Kobashi K, More KL. Microstructural characterization of diamond thin films. Proceedings - The Electrochemical Society. 1989;89(12):202.
Williams, B. E., et al. “Microstructural characterization of diamond thin films.” Proceedings - The Electrochemical Society, vol. 89, no. 12, 1989, p. 202.
Williams BE, Glass JT, Davis RF, Kobashi K, More KL. Microstructural characterization of diamond thin films. Proceedings - The Electrochemical Society. 1989;89(12):202.
Published In
Proceedings - The Electrochemical Society
Publication Date
1989
Volume
89
Issue
12
Start / End Page
202
Location
Los Angeles, CA, USA