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Epitaxial growth, doping, and analytical characterization of monocrystalline beta-SiC semiconductor thin films

Publication ,  Journal Article
Kim, HJ; Kong, H; Edmond, JA; Ryu, J; Palmour, J; Jr, CCH; Glass, JT; Davis, RF
Published in: J. Vac. Sci. Technol. A, Vac. Surf. Films (USA)
1988

Summary form only given. The authors discuss growth of epitaxial films of β-SiC on high resistivity substrates, using chemical vapour deposition. They study the defects and effects of doping, and manufacture Schottky diodes

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Published In

J. Vac. Sci. Technol. A, Vac. Surf. Films (USA)

DOI

Publication Date

1988

Volume

6

Issue

3

Start / End Page

1954 / 1956

Location

Anaheim, CA, USA

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Kim, H. J., Kong, H., Edmond, J. A., Ryu, J., Palmour, J., Jr, C. C. H., … Davis, R. F. (1988). Epitaxial growth, doping, and analytical characterization of monocrystalline beta-SiC semiconductor thin films. J. Vac. Sci. Technol. A, Vac. Surf. Films (USA), 6(3), 1954–1956. https://doi.org/10.1116/1.575214
Kim, H. J., H. Kong, J. A. Edmond, J. Ryu, J. Palmour, Carter C. H. Jr, J. T. Glass, and R. F. Davis. “Epitaxial growth, doping, and analytical characterization of monocrystalline beta-SiC semiconductor thin films.” J. Vac. Sci. Technol. A, Vac. Surf. Films (USA) 6, no. 3 (1988): 1954–56. https://doi.org/10.1116/1.575214.
Kim HJ, Kong H, Edmond JA, Ryu J, Palmour J, Jr CCH, et al. Epitaxial growth, doping, and analytical characterization of monocrystalline beta-SiC semiconductor thin films. J Vac Sci Technol A, Vac Surf Films (USA). 1988;6(3):1954–6.
Kim, H. J., et al. “Epitaxial growth, doping, and analytical characterization of monocrystalline beta-SiC semiconductor thin films.” J. Vac. Sci. Technol. A, Vac. Surf. Films (USA), vol. 6, no. 3, 1988, pp. 1954–56. Manual, doi:10.1116/1.575214.
Kim HJ, Kong H, Edmond JA, Ryu J, Palmour J, Jr CCH, Glass JT, Davis RF. Epitaxial growth, doping, and analytical characterization of monocrystalline beta-SiC semiconductor thin films. J Vac Sci Technol A, Vac Surf Films (USA). 1988;6(3):1954–1956.

Published In

J. Vac. Sci. Technol. A, Vac. Surf. Films (USA)

DOI

Publication Date

1988

Volume

6

Issue

3

Start / End Page

1954 / 1956

Location

Anaheim, CA, USA

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences