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A workload-based analysis of software aging, and rejuvenation

Publication ,  Journal Article
Bao, Y; Sun, X; Trivedi, KS
Published in: IEEE Transactions on Reliability
September 1, 2005

We present a hierarchical model for the analysis of proactive fault management in the presence of system resource leaks. At the low level of the model hierarchy is a degradation model in which we use a nonhomogeneous Markov chain to establish an explicit connection between resource leaks, and the failure rate. With the degradation model, we prove that the failure rate is asymptotically constant in the absence of resource leaks, and it is increasing as leaks occur & accumulate, which confirms the resource leaks as an aging source. The proactive fault management (PFM) is modeled at the higher level as a semi-Markov process. The PFM model takes as input the degradation analysis from the low-level model, and allows us to determine optimal rejuvenation schedules with respect to various system measures. © 2005 IEEE.

Duke Scholars

Published In

IEEE Transactions on Reliability

DOI

ISSN

0018-9529

Publication Date

September 1, 2005

Volume

54

Issue

3

Start / End Page

541 / 548

Related Subject Headings

  • Operations Research
  • 4612 Software engineering
  • 4010 Engineering practice and education
  • 0906 Electrical and Electronic Engineering
  • 0803 Computer Software
 

Citation

APA
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ICMJE
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Bao, Y., Sun, X., & Trivedi, K. S. (2005). A workload-based analysis of software aging, and rejuvenation. IEEE Transactions on Reliability, 54(3), 541–548. https://doi.org/10.1109/TR.2005.853442
Bao, Y., X. Sun, and K. S. Trivedi. “A workload-based analysis of software aging, and rejuvenation.” IEEE Transactions on Reliability 54, no. 3 (September 1, 2005): 541–48. https://doi.org/10.1109/TR.2005.853442.
Bao Y, Sun X, Trivedi KS. A workload-based analysis of software aging, and rejuvenation. IEEE Transactions on Reliability. 2005 Sep 1;54(3):541–8.
Bao, Y., et al. “A workload-based analysis of software aging, and rejuvenation.” IEEE Transactions on Reliability, vol. 54, no. 3, Sept. 2005, pp. 541–48. Scopus, doi:10.1109/TR.2005.853442.
Bao Y, Sun X, Trivedi KS. A workload-based analysis of software aging, and rejuvenation. IEEE Transactions on Reliability. 2005 Sep 1;54(3):541–548.

Published In

IEEE Transactions on Reliability

DOI

ISSN

0018-9529

Publication Date

September 1, 2005

Volume

54

Issue

3

Start / End Page

541 / 548

Related Subject Headings

  • Operations Research
  • 4612 Software engineering
  • 4010 Engineering practice and education
  • 0906 Electrical and Electronic Engineering
  • 0803 Computer Software