Pulsed Laser Imaging Demonstrates the Mechanism of Current Rectification at a Hydrogel Interface


Journal Article

The accumulation or depletion of charge carriers at a p-n junction results in electronic rectification.1 Similarly, we show that accumulation or depletion of ions underlies ionic rectification at a single hydroge.-electrolyte interface. We monitored the rapid formation and collapse of ionic gradients at the hydrogel-electrolyte interface of natural2′3 and synthetic4 charged microparticles by the use of pulsed-laser microscopy.5,6 We conclude that the flow of the current is determined by the charge of the hydrogel and the geometry of the electric field applied to it. Our findings can be utilized to design hydrogel-based microswitches and “wet” integrated circuits. © 1995, American Chemical Society. All rights reserved.

Full Text

Duke Authors

Cited Authors

  • Marszalek, PE; Markin, VS; Tanaka, T; Kawaguchi, H; Fernandez, JM

Published Date

  • November 1, 1995

Published In

Volume / Issue

  • 11 / 11

Start / End Page

  • 4196 - 4198

Electronic International Standard Serial Number (EISSN)

  • 1520-5827

International Standard Serial Number (ISSN)

  • 0743-7463

Digital Object Identifier (DOI)

  • 10.1021/la00011a004

Citation Source

  • Scopus