Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation

Journal Article (Journal Article)

The authors describe conductive tip atomic force microscope used for imaging carbon nanotubes at low temperatures. The instrument allows them to measure the tip-nanotube conductance while performing the topographic scan of the nanotubes on a nonconductive Si O2 substrate. For nanotubes weakly coupled to the contacting electrode, they observe the Coulomb blockade pattern in the tip-nanotube conductance. They reversibly modified the conductance pattern by applying the tip pressure. © 2007 American Institute of Physics.

Full Text

Duke Authors

Cited Authors

  • Prior, M; Makarovski, A; Finkelstein, G

Published Date

  • August 10, 2007

Published In

Volume / Issue

  • 91 / 5

International Standard Serial Number (ISSN)

  • 0003-6951

Digital Object Identifier (DOI)

  • 10.1063/1.2759986

Citation Source

  • Scopus