Cross section measurements of high-pT dilepton final-state processes using a global fitting method

Published

Journal Article

We present a new method for studying high-pT dilepton events (e±e, μ±μ, e±μ) and simultaneously extracting the production cross sections of pp̄→tt̄, pp̄→W+W-, and pp̄→Z0→τ+τ- at a center-of-mass energy of s=1.96TeV. We perform a likelihood fit to the dilepton data in a parameter space defined by the missing transverse energy and the number of jets in the event. Our results, which use 360pb-1 of data recorded with the CDF II detector at the Fermilab Tevatron Collider, are σ(tt̄)=8.5-2.2+2.7pb, σ(W+W-)=16.3-4. 4+5.2pb, and σ(Z0→τ+τ-)=291-46+50pb. © 2008 The American Physical Society.

Full Text

Duke Authors

Cited Authors

  • Abulencia, A; Adelman, J; Affolder, T; Akimoto, T; Albrow, MG; Ambrose, D; Amerio, S; Amidei, D; Anastassov, A; Anikeev, K; Annovi, A; Antos, J; Aoki, M; Apollinari, G; Arguin, JF; Arisawa, T; Artikov, A; Ashmanskas, W; Attal, A; Azfar, F; Azzi-Bacchetta, P; Azzurri, P; Bacchetta, N; Badgett, W; Barbaro-Galtieri, A; Barnes, VE; Barnett, BA; Baroiant, S; Bartsch, V; Bauer, G; Bedeschi, F; Behari, S; Belforte, S; Bellettini, G; Bellinger, J; Belloni, A; Benjamin, D; Beretvas, A; Beringer, J; Berry, T; Bhatti, A; Binkley, M; Bisello, D; Blair, RE; Blocker, C; Blumenfeld, B; Bocci, A; Bodek, A; Boisvert, V; Bolla, G; Bolshov, A; Bortoletto, D; Boudreau, J; Boveia, A; Brau, B; Brigliadori, L; Bromberg, C; Brubaker, E; Budagov, J; Budd, HS; Budd, S; Budroni, S; Burkett, K; Busetto, G; Bussey, P; Byrum, KL; Cabrera, S; Campanelli, M; Campbell, M; Canelli, F; Canepa, A; Carillo, S; Carlsmith, D; Carosi, R; Carron, S; Casarsa, M; Castro, A; Catastini, P; Cauz, D; Cavalli-Sforza, M; Cerri, A; Cerrito, L; Chang, SH; Chen, YC; Chertok, M; Chiarelli, G; Chlachidze, G; Chlebana, F; Cho, I; Cho, K; Chokheli, D; Chou, JP; Choudalakis, G; Chuang, SH; Chung, K; Chung, WH; Chung, YS; Ciljak, M; Ciobanu, CI; Ciocci, MA

Published Date

  • July 14, 2008

Published In

Volume / Issue

  • 78 / 1

Electronic International Standard Serial Number (EISSN)

  • 1550-2368

International Standard Serial Number (ISSN)

  • 1550-7998

Digital Object Identifier (DOI)

  • 10.1103/PhysRevD.78.012003

Citation Source

  • Scopus