Scholars@Duke publication: Compact diode-laser based rubidium frequency reference

Compact diode-laser based rubidium frequency reference

Publication , Journal Article

Vukicevic, N; Zibrov, AS; Hollberg, L; Walls, FL; Kitching, J; Robinson, HG

Published in: IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL

{The performance of a simple microwave frequency reference based on Raman scattering in an atomic vapor is examined. This reference has the potential to be compact, low-power, and insensitive to acceleration. Several design architectures have been evaluated with a tabletop experiment in order to guide the future development of a compact system. Fractional frequency deviations of less than or equal to 5 X 10(-11) appear to be feasible.}

Duke Scholars

Author Hugh Robinson Physics

Published In

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL

ISSN

0885-3010

Volume

Issue

Start / End Page

1122 / 1126

Location

{345 E 47TH ST, NEW YORK, NY 10017-2394 USA}

Publisher

{IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC}

Related Subject Headings

Acoustics
09 Engineering
02 Physical Sciences

Citation

APA

Chicago

ICMJE

MLA

NLM

Vukicevic, N., Zibrov, A. S., Hollberg, L., Walls, F. L., Kitching, J., & Robinson, H. G. (n.d.). Compact diode-laser based rubidium frequency reference. IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 47(5), 1122–1126.

Vukicevic, N., A. S. Zibrov, L. Hollberg, F. L. Walls, J. Kitching, and H. G. Robinson. “Compact diode-laser based rubidium frequency reference.” IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL 47, no. 5 (n.d.): 1122–26.

Vukicevic N, Zibrov AS, Hollberg L, Walls FL, Kitching J, Robinson HG. Compact diode-laser based rubidium frequency reference. IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL. 47(5):1122–6.

Vukicevic, N., et al. “Compact diode-laser based rubidium frequency reference.” IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, vol. 47, no. 5, {IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC}, pp. 1122–26.