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Goodness-of-fit tests for GEE modeling with binary responses.

Publication ,  Journal Article
Barnhart, HX; Williamson, JM
Published in: Biometrics
June 1998

Analysis of data with repeated measures is often accomplished through the use of generalized estimating equations (GEE) methodology. Although methods exist for assessing the adequacy of the fitted models for uncorrelated data with likelihood methods, it is not appropriate to use these methods for models fitted with GEE methodology. We propose model-based and robust (empirically corrected) goodness-of-fit tests for GEE modeling with binary responses based on partitioning the space of covariates into distinct regions and forming score statistics that are asymptotically distributed as chi-square random variables with the appropriate degrees of freedom. The null distribution and the statistical power of the proposed goodness-of-fit tests were assessed using simulated data. The proposed goodness-of-fit tests are illustrated by two examples using data from clinical studies.

Duke Scholars

Published In

Biometrics

ISSN

0006-341X

Publication Date

June 1998

Volume

54

Issue

2

Start / End Page

720 / 729

Location

England

Related Subject Headings

  • Wisconsin
  • Statistics & Probability
  • Risk Factors
  • Reproducibility of Results
  • Models, Statistical
  • Male
  • Longitudinal Studies
  • Likelihood Functions
  • Humans
  • Female
 

Citation

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MLA
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Barnhart, H. X., & Williamson, J. M. (1998). Goodness-of-fit tests for GEE modeling with binary responses. Biometrics, 54(2), 720–729.
Barnhart, H. X., and J. M. Williamson. “Goodness-of-fit tests for GEE modeling with binary responses.Biometrics 54, no. 2 (June 1998): 720–29.
Barnhart HX, Williamson JM. Goodness-of-fit tests for GEE modeling with binary responses. Biometrics. 1998 Jun;54(2):720–9.
Barnhart, H. X., and J. M. Williamson. “Goodness-of-fit tests for GEE modeling with binary responses.Biometrics, vol. 54, no. 2, June 1998, pp. 720–29.
Barnhart HX, Williamson JM. Goodness-of-fit tests for GEE modeling with binary responses. Biometrics. 1998 Jun;54(2):720–729.
Journal cover image

Published In

Biometrics

ISSN

0006-341X

Publication Date

June 1998

Volume

54

Issue

2

Start / End Page

720 / 729

Location

England

Related Subject Headings

  • Wisconsin
  • Statistics & Probability
  • Risk Factors
  • Reproducibility of Results
  • Models, Statistical
  • Male
  • Longitudinal Studies
  • Likelihood Functions
  • Humans
  • Female