Single- versus multi-detector row CT of the brain: quality assessment.


Journal Article

PURPOSE: To assess the quality of brain computed tomographic (CT) studies obtained with a four-channel multi-detector row CT scanner compared with those obtained with a single-detector row CT scanner. MATERIALS AND METHODS: Forty-seven patients referred for brain CT were imaged with both single- and multi-detector row scanners. Single-detector row CT images were acquired by using a 5-mm-collimated beam in the transverse mode. Multi-detector row CT images were acquired in four simultaneous 2.5-mm-thick sections, which were combined in projection space to create two contiguous 5-mm-thick sections. Two neuroradiologists blinded to the acquisition technique independently evaluated the CT image pairs, which were presented in a stacked mode on two adjacent monitors. Each study was graded by using a five-point scale for posterior fossa artifact, overall image quality, and overall preference. RESULTS: Multi-detector row CT studies were acquired 1.8 times faster than single-detector row CT studies (0.92 vs 0.52 section per second). Multi-detector row CT posterior fossa artifact was less than single-detector row CT posterior fossa artifact in 87 (93%) of 94 studies. Overall preference was expressed for multi-detector row CT in 84 (89%) of 94 studies. The differences in mean posterior fossa artifact scores (P <.001) and mean overall image quality scores (P =.001) were significant. CONCLUSION: Brain CT images obtained with multi-detector row CT resulted in significantly less posterior fossa artifact and were preferred to single-detector row CT images.

Full Text

Duke Authors

Cited Authors

  • Jones, TR; Kaplan, RT; Lane, B; Atlas, SW; Rubin, GD

Published Date

  • June 2001

Published In

Volume / Issue

  • 219 / 3

Start / End Page

  • 750 - 755

PubMed ID

  • 11376264

Pubmed Central ID

  • 11376264

International Standard Serial Number (ISSN)

  • 0033-8419

Digital Object Identifier (DOI)

  • 10.1148/radiology.219.3.r01jn47750


  • eng

Conference Location

  • United States