Measurement of the ${B}^{-}$ lifetime using a simulation free approach for trigger bias correction

Journal Article (Academic article)

Full Text

Duke Authors

Cited Authors

  • Aaltonen, ; T, ; al, E

Published Date

  • February 2011

Published In

  • Phys. Rev. D

Volume / Issue

  • 83 /

Start / End Page

  • 032008 -

Published By

Digital Object Identifier (DOI)

  • 10.1103/PhysRevD.83.032008