Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities

Published

Journal Article

The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.

Duke Authors

Cited Authors

  • Cina, J; Carin, L

Published Date

  • January 1, 1995

Published In

Volume / Issue

  • 1 /

Start / End Page

  • 225 - 228

International Standard Serial Number (ISSN)

  • 0149-645X

Citation Source

  • Scopus