Deviation-based LFSR reseeding for test-data compression


Journal Article

Linear feedback shift register (LFSR) reseeding forms the basis for many test-compression solutions. A seed can be computed for each test cube by solving a system of linear equations based on the feedback polynomial of the LFSR. Despite the availability of numerous LFSR-reseeding-based compression methods in the literature, relatively little is known about the effectiveness of these seeds for unmodeled defects, particularly since there are often several candidate seeds for a test cube. We use the recently proposed output deviation measure of the resulting patterns as a metric to select appropriate LFSR seeds. Experimental results are reported using test patterns for stuck-at and transition faults derived from selected seeds for the ISCAS-89 and the IWLS-05 benchmark circuits. These patterns achieve higher coverage for transition and stuck-open faults than patterns obtained using other seed-generation methods for LFSR reseeding. Given a pattern pair (p1, p2) for transition faults, we also examine the transition-fault coverage for launch on capture by using p1 and p2 to separately compute output deviations. Results show that p1 tends to be better when there is a high proportion of do-not-care bits in the test cubes, while p2 is a more appropriate choice when the transition-fault coverage is high. © 2009 IEEE.

Duke Authors

Cited Authors

  • Wang, Z; Fang, H; Chakrabarty, K; Bienek, M

Published Date

  • January 1, 2009

Published In

Volume / Issue

  • 28 / 1

Start / End Page

  • 259 - 271

International Standard Serial Number (ISSN)

  • 0278-0070

Citation Source

  • Scopus